2020, issue 1, p. 83-92

Received 24.02.2020; Revised 01.03.2020; Accepted 10.03.2020

Published 31.03.2020; First Online 26.04.2020


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V.T. Kondratov 1 *

1 V.M. Glushkov Institute of Cybernetics, Kyiv, Ukraine

* Correspondence: This email address is being protected from spambots. You need JavaScript enabled to view it.


Introduction. The paper identifies twelve problems of metrological reliability of wireless sensor systems that require their solution.

The most urgent is the problem of determining the main parameters of the metrological reliability of wireless sensor systems. It is closely related to solving the problem of self-calibration of optical smart sensors that are part of the smart nodes of the system.

The task of self-calibration of smart sensors is solved when three basic conditions are met: 1) when creating and using structurally redundant optical sensors designed to implement methods of redundant measurements; 2) when developing LEDs or other highly stable sources of optical radiation, including those with controlled parameters, for any given spectral range of wavelengths; 3) when creating in micro-performance filters on a priori given range of the spectrum of optical sines.

The article describes two methods of metrological support for BSS smart sensors, based on the introduction of information redundancy by conducting three clock cycles of measuring physical quantity with a smart sensor, followed by processing the data using an a priori derived algorithm. The disadvantages and advantages of the methods are shown.

It is stated that the use of the theory of excess measurements is the only correct way to solve the problem of self-calibration of sensors and measuring instruments.

Given the harsh operating conditions of optical smart sensors, it is preferable to manufacture them using high technology.

Today, in Ukraine, no one is engaged in a practical solution to the problems of metrological reliability of wireless sensor systems and the solution of the problems of self-calibration of smart sensors.


Keywords: optical smart sensors, self-calibration, wireless sensor systems, methods of redundant measurements, problems of metrological reliability


Cite as: Kondratov V.T. Metrological Support for Wireless Sensor Systems. Cybernetics and Computer Technologies. 2020. 1. 83–92. (in Russian) https://doi.org/10.34229/2707-451X.20.1.9



           1.     Shtanko N.N. An overview of location methods. http://aes.psuti.ru/wp-content/uploads/2017/10/PTiTT_2017_3.pdf (in Russian) (accessed: 01.02.2020)

           2.     Metrological support. http://metrob.ru/html/mo/ (in Russian) (accessed: 01.02.2020)

           3.     Wireless ZigBee standard. https://rozetka.com.ua/umnie-datchiki/c4638399/besprovodnoy-standart141008=zigbee/ (in Russian) (accessed: 01.02.2020)

           4.     Self-calibration during measurements. http://robotosha.ru/electronics/self-calibration-measurements.html (in Russian) (accessed: 01.02.2020)

           5.     Kondratov V.T. Theory of excess measurements the theory of world significance. Vimíryuval'na ta obchislyuval'na tekhníka v tekhnologíchnikh protsesakh. 2007. 1. P. 152 160. (in Russian)

           6.     Kondratov V.T. The theory of redundant measurements and its structure. Scientific works of the X-th Anniversary International Scientific and Technical. conf. “Fundamental and applied problems of instrument making, computer science and economics”. The book "Priborostroyeniye". M .: MSU PI, 2007. P. 143150. (in Russian)

           7.     Kondratov V.T. New measurement strategy. Legislative and applied metrology. 2008. 3. P. 101121. (in Russian)

           8.     Romanov V.O. Requirements to sensor nodes in Internet of Things networks. Computerny, measure and system. 2018. 17. P. 15. (in Russian) http://dspace.nbuv.gov.ua/handle/123456789/150600



ISSN 2707-451X (Online)

ISSN 2707-4501 (Print)

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