2025, issue 3, p. 118-125

Received 19.05.2025; Revised 27.06.2025; Accepted 02.09.2025

Published 29.09.2025; First Online 30.09.2025

https://doi.org/10.34229/2707-451X.25.3.11

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MSC 90C15, 49M27

Interleaved ADC: Analysis of Accuracy and Methods for Improving It

Volodymyr Romanov ORCID ID favicon Big,   Igor Galelyuka * ORCID ID favicon Big

V.M. Glushkov Institute of Cybernetics of the NAS of Ukraine, Kyiv

* Correspondence: This email address is being protected from spambots. You need JavaScript enabled to view it.

 

Introduction. In many modern applied tasks, it`s necessary to measure fast-moving processes or high-frequency signals, while ensuring a wide range and high bandwidth of the measurement channel. This can be achieved through the usage of high-speed analog-to-digital converters (ADCs), what is not always feasible or rational for a number of systems, in particular modern information and communication technologies, surveillance and radar systems, industrial measurement systems, Internet of Things (IoT) tools and wireless sensor networks, where the main requirements are a significant increase in the sampling frequency with a guarantee of high accuracy of signal acquiring.

One of the approaches to solve this task is to use several ADCs in the measurement channel, which work parallel in interleave mode and form the combined code at the output. Theoretically, by shifting the triggering signals of each of these convertors, it is possible to increase the sampling frequency of the input signal as many times as number of ADCs in the interleave mode are connected to the measurement channel after the sensor.

The purpose of the work is to increase the accuracy of ADCs in the interleave mode based on the analysis of errors, caused by the action of influential factors, and methods for minimizing these errors. The usage of these methods makes it possible to increase the throughput of the measurement channel by using several ADCs in the interleave mode without increasing the conversion error and overloading individual ADCs.

Conclusions. Interleaved ADCs allow reaching greater throughput compared to standard converters. Using two or more standard ADCs in interleaved mode allows for multiple increase in throughput. However, the accuracy of interleaved ADCs is affected by the mismatch between the parameters of individual converters and their components. The parameters of interleaved ADCs have been sufficiently detailed considered in the frequency domain. However, this analysis primarily considers frequency disturbances that appear from differences in the formation of numerical samples by each converter. The amplitude errors of these samples are usually considered due to differences in bias currents and bias voltages between individual ADCs in interleaved mode. However, the amplitude errors due to differences in frequency response, parameters of sample and hold amplifiers remain outside the attention of developers. The impact of these discrepancies on the overall accuracy of interleaved ADCs and methods for minimizing them are discussed in this publication.

 

Keywords: analog-to-digital converter, interleaved ADCs, sample-and-hold amplifier, measurement channel, minimization of conversion errors.

 

Cite as: Romanov V., Galelyuka I. Interleaved ADC: Analysis of Accuracy and Methods for Improving It. Cybernetics and Computer Technologies. 2025. 3. P. 118–125. (in Ukrainian) https://doi.org/10.34229/2707-451X.25.3.11

 

References

           1.     Harris J. The ABCs of Interleaved ADCs. https://www.analog.com/en/resources/technical-articles/the-abcs-of-interleaved-adcs.html (accessed: 20.05.2025)

           2.     Dissanayake S.D., Armstrong J. Comparison of ACO-OFDM, DCO-OFDM and ADO-OFDM in IM/DD systems. J. Lightw. Technol. 2013. 31(7). P. 1063–1072. https://doi.org/10.1109/JLT.2013.2241731

           3.     Ponnuru S., Seo M., Madhow U., Rodwell M. Joint mismatch and channel compensation for high-speed OFDM receivers with time-interleaved ADCs. IEEE Trans. Commun. 2010. 58 (8). P. 2391–2401. http://dx.doi.org/10.1109/TCOMM.2010.08.090693

           4.     Huynh V.T.D., Noels N., Steendam H. Effect of offset mismatch in time-interleaved ADC circuits on OFDM-BER performance. IEEE Trans. Circuits Syst. I, Reg. Papers. 2017. 64 (8). P. 2195–2206. https://doi.org/10.1109/TCSI.2017.2694059

           5.     Huynh V.T.D., Noels N., Steendam H. Closed-form BER expression for OFDM with the effect of TI-ADC’s timing mismatch. Proc. 25th Int. Conf. Telecommun (ICT). 2018. P. 132–137. https://doi.org/10.1109/ICT.2018.8464910

           6.     Salib A., Flanagan M.F., Cardiff B. A high-precision time skew estimation and correction technique for time-interleaved ADCs. IEEE Trans. Circuits Syst. I, Reg. Papers. 2019. 66(10). P. 3747–3760. http://dx.doi.org/10.1109/TCSI.2019.2915282

           7.     Song J., Ragab K., Tang X., Sun N. A 10-b 800-ms/s timeinterleaved SAR ADC with fast variance-based timing-skew calibration. IEEE J. Solid-State Circuits. 2017. 52 (10). P. 2563–2575. http://dx.doi.org/10.1109/JSSC.2017.2713523

           8.     Li J., Wu S., Liu Y., Ning N., Yu Q. A digital timing mismatch calibration technique in time-interleaved ADCs. IEEE Trans. Circuits Syst. II, Exp. Briefs. 2014. 61 (7). P. 486–490. http://dx.doi.org/10.1109/TCSII.2014.2327333

           9.     Wei H., Zhang P., Sahoo B.D., Razavi B. An 8 bit 4 gs/s 120 mw CMOS ADC. IEEE J. Solid-State Circuits. 2014. 49 (8). P. 1751–1761. http://dx.doi.org/10.1109/JSSC.2014.2313571

       10.     Chen S., Wang L., Zhang H., Murugesu R., Dunwell D., Carusone A.C. All-digital calibration of timing mismatch error in time-interleaved analog-to-digital converters. IEEE Trans. Very Large Scale Integr. (VLSI) Syst. 2017. 25 (9). P. 2552–2560. https://doi.org/10.1109/TVLSI.2017.2703141

       11.     Mishra A., Jagannatham A.K., Hanzo L. Sparse Bayesian learning-aided joint sparse channel estimation and ML sequence detection in space-time trellis coded MIMO-OFDM systems. IEEE Trans. Commun. 2020. 68 (2). P. 1132–1145. https://doi.org/10.1109/TCOMM.2019.2953260

 

 

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